standarddeviationcalculator.net

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Statistics

Process capability index calculator

Paste your measurements in time order, or enter the mean and standard deviations, with the specification limits. The calculator returns all six capability indices, the expected defect rate and a chart of the process against the limits.

Order matters: the within-process σ comes from the ranges between consecutive values.

Cpk 1.49
Ratingcapable
Cp1.73
Pp / Ppk1 / 0.857
Sigma level (3 × Cpk)4.46
Z.bench (within)4.46
Expected ppm defective (within)4.089
Expected yield99.9996%
Mean, within SD10.01, 0.0134507
StabilityPpk is well below Cpk: the process mean shifts or drifts over time, so the long-term output (about 5382 ppm out of spec) is worse than the short-term σ suggests.
Short-term (within σ)Long-term (overall σ)
Cp1.73Pp1
Cpk1.49Ppk0.857
Cpu1.49Ppu0.857
Cpl1.98Ppl1.14
Expected ppm out of spec4.089ppm5382
9.949.969.981010.0210.0410.06051015202530 measurement

━ within σ   ┄ overall σ   ━ LSL and USL

Show the working, step by step
  1. Mean and overall (long-term) SD of all the measurements.

    x̄ = 10.01 σoverall = s = 0.0233415

  2. Within (short-term) SD from the average moving range between consecutive values.

    MR̄ = 0.0151724 σwithin = MR̄ ÷ d₂ = 0.0151724 ÷ 1.128 = 0.0134507

  3. Cp compares the specification width with six within-σ.

    Cp = (USL − LSL) ÷ 6σ = (10.07 − 9.93) ÷ (6 × 0.0134507) = 1.735

  4. One-sided indices: distance from the mean to each limit in units of 3σ.

    Cpu = (10.07 − 10.01) ÷ (3 × 0.0134507) = 1.487 Cpl = (10.01 − 9.93) ÷ (3 × 0.0134507) = 1.983

  5. Cpk is the smaller one-sided index.

    Cpk = 1.487

  6. Pp and Ppk are the same formulas with the overall σ.

    Ppk = 0.8568, Pp = 0.9996

  7. Expected fraction out of specification, assuming a normal process.

    ppm = 10⁶ × [(1 − Φ(4.461)) + Φ(−5.948)] = 4.089 3 × Cpk = 4.46 (nearest limit is 4.46 σ away)

Cpk = 1.49 means the nearer limit is 4.46 within-σ from the mean, about 4.09 ppm beyond that limit alone.

The formulas

Cp = (USL − LSL) ÷ 6σwithin Cpu = (USL − μ) ÷ 3σwithin Cpl = (μ − LSL) ÷ 3σwithin Cpk = min(Cpu, Cpl) Pp, Ppk: the same with σoverall σwithin = MR̄ ÷ 1.128 σoverall = sample SD of all values

A worked example

The default data are 30 shaft diameters in mm, measured in production order, with specification limits LSL = 9.93 and USL = 10.07.

  1. The mean is 10.01 and the overall sample SD is 0.02334.
  2. The 29 moving ranges average MR̄ = 0.01517, so σwithin = 0.01517 ÷ 1.128 = 0.01345.
  3. Cp = (10.07 − 9.93) ÷ (6 × 0.01345) = 0.14 ÷ 0.0807 = 1.73.
  4. Cpu = (10.07 − 10.01) ÷ (3 × 0.01345) = 1.49 and Cpl = (10.01 − 9.93) ÷ (3 × 0.01345) = 1.98, so Cpk = 1.49.
  5. With the overall SD instead: Pp = 0.14 ÷ (6 × 0.02334) = 1.00 and Ppk = 0.06 ÷ (3 × 0.02334) = 0.86.

From the within σ the process is capable (Cpk 1.49 > 1.33), with about 4 ppm expected out of specification. From the overall σ it is not (Ppk 0.86 < 1), with about 5,400 ppm.

Interpreting the gap

The data drift: the diameters climb from about 9.98 to 10.05 and fall back. Consecutive parts are close to each other, so the moving ranges are small and Cpk looks healthy. The whole run, though, spreads much wider. Cpk describes what the process could do if its mean held still; Ppk describes what customers actually received. A gap this size means the next step is to find and remove the cause of the drift (tool wear, temperature, a material change), not to tighten the short-term variation.

Rough benchmarks for Cpk: below 1 not capable, 1 to 1.33 marginal, 1.33 or more capable, 1.67 for critical characteristics, 2 for six sigma. All of these assume a stable process with roughly normal output. For a skewed characteristic (flatness, runout) the ppm figures can be badly wrong.

Common mistakes

  • Calculating Cpk from a process that is not in statistical control. Check a control chart first.
  • Shuffling the measurements before pasting them. The moving-range σ needs production order.
  • Reporting Cp alone. A process with Cp = 2 can still make scrap if it is off-centre; Cpk catches that.
  • Drawing conclusions from 20 or 30 parts. Capability indices from small samples have wide confidence intervals; 50 to 100 measurements is a common minimum.
Process capability index calculator: the worked example on this page, with its result and chart
Process capability index calculator: the worked example above, at a glance.

Common questions

What is a process capability index?

A ratio that compares the width of a specification with the natural spread of a process. Cp = (USL − LSL) ÷ 6σ asks whether the process could fit inside the limits; Cpk, the smaller of (USL − μ) ÷ 3σ and (μ − LSL) ÷ 3σ, also accounts for where the process is centred. Values above 1.33 are the usual target.

What is the difference between Cpk and Ppk?

Same formula, different σ. Cpk uses the within (short-term) σ, here estimated from the average moving range between consecutive measurements. Ppk uses the overall σ of all the data, which also includes shifts and drifts over time. If Ppk is much lower than Cpk, the process is not stable.

How is the within standard deviation calculated from individual measurements?

Take the absolute difference between each measurement and the one before it (the moving range), average those differences to get MR̄, and divide by d₂ = 1.128. This is the method used for an individuals control chart, and it is why the order of the measurements matters.

How do I convert Cpk to ppm defective or a sigma level?

3 × Cpk is the distance from the mean to the nearer limit in standard deviations. The normal tail area beyond that distance, times one million, is the ppm beyond that limit. The calculator adds both tails. Cpk = 1.33 means 4σ to the nearer limit and about 32 ppm on that side; Cpk = 2 is the six sigma level.

Can I use this with only one specification limit?

Yes. Leave the other limit blank. Cpk (and Ppk) then equal the one-sided index for the limit you gave, and Cp and Pp are not defined because there is no specification width.